Parallel Genetic Algorithm ofTest Generation ForDigital Circuits
Yuri Skobtsov, A I El-Khatib, D.Е. Ivanov · 2006
Theparallel genenic algorithms areconsidered for problem oftest generation. Thedifferent formsofparallelization ofgenetic algorithms areinvestigated fortest generation. Keywords - genenic algorithms, parallel calculations, test generation, digital circuits. IINTRODUCTION Genetic algorithms (GA)aresuccessfully usedforthetest generation ofdigital circuits (1)(from 90th) along withthe deterministic structural methods. Experience showsthat genetic algorithms givethebestresults forthecircuits, oriented tothedataprocessing, whilethedeterministic methods moresuccessfully workforsequential circuits with difficult control logic. Inthis paper represented parallel GA, whichallow extending aneffective application GA forthis problem.