DESIGNING HIXED-MDE TEST PATTERN GENERATORS FOR HlNltlWl-OVERHEAD SELF-TESTING VLSl CIRCUITS
Andrzej Krakiewski · 1989
A simple technique for designing self-testable VLSl circuits, cherecterized by low silim area werheed end maximum testing speed, is proposed An oripinel feature of this built-in self-test design technique is a procedure for synthesis of test pattern generators. Its objective is to design mixed-mode generatom of minimal complexity that maximize the fault sensitizing milities of test sequences produced within the allowable test running time.