Weighted Random and Transition Density Patterns For Scan-BIST ∗
Farhana Rashid, Vishwani D. Agrawal · 2012
Weighted random patterns (WRP) and transition density patterns (TDP) can be effectively deployed to optimize test length with higher fault coverage in scan-BIST circuits. New test pattern generators (TPG) are proposed to generate weighted random patterns and controlled transition density patterns to facilitate efficient scan-BIST implementations. We achieve reduction in test application time without sacrificing fault coverage while maintaining any given test power constrain by dynamically adapting the scan clock, accomplished by a built-in hardware monitor of transition density in the scan register. 1