CIRcUIls USING INRJT VECMlR IN PAIRS To RESEARCH
Liu Ming-jian, Peng Jiehua · 1991
This paper researches a new method of test generation for large combinational circuits using input vectors in pairs. The forming rules of the best test codes are analysed and found. The cut theorm and cut test generation are researched. The difference of test generation is compared between the circuit is cut or no cut. The experiment results are completely accordant with the theory. This proves that the approach of test generation in the paper is correct and