Digital processing results of microwaves measurements by a "spectral window" method.
A.V. Bednov, A. M. Kudryavtsev, Sergey M. Nikulin · IEEE International Conference on Actual Problems of Electronics Instrument Engineering · 2004
The method is used for reconstruction of S-parameters of integrated SBF-unit by measurements conducted in standard channel. Main feature of the method is application of spectral analysis to the data measured in frequency range. The advantages with respect to the time window are discussed. The method for increase of resolving capability by the artificial extension of frequency range is proposed.