M-Testability: An Approach for Data-Path
Testability Evaluation · 1994
In this paper, a new M-testability approach is iiitroduced. M-testability is based on a new Variable Testability Measure (WM) appropriate in high-level synthesis. It is shown that VTM is a generalization of the C-testability concept which is extended to M-testability to deal with more general arrays such as those of non identical cells or functional primitives in data paths. The elaboration of this concept led to the development of a classified-level approach applied to the data path primitives. Some examples are given to show the practical applicability of the proposed technique in high level synthesis.