A Four-Valued Logic and Switch-Level
Mou Hu · 1994
In this paper, the application of a four-valued stw3ed.A switch-level operator faultmodel is proposed. Switch-level U difference and 2 difference of a function to a fault are defined. Amethod toderive switch-level differences is given. Finally, a new switch-level test generation algorithm for CMOS circuits is presented. bgi~ to the switch-level test genercrtiOn is