Performance Analysis forClockandDataRecovery Circuits underProcess Variation
Xin Pan, W. B. Jonel · 2008
Inthis research, aclock anddatarecovery circuit islaidoutby TSMC 180nmtechnology. The performance variation causedbyprocess variation is investigated byHSPICEsimulation, andcompared withthe theoretical analysis results derived through themathematical modeloftheclock anddatarecovery circuit. Theresults demonstrate that ourtheoretical model matches well withthe real simulations. Boththeoretical andsimulation results also indicate that process variations inthelowpassfilter have significant impact onperformance parameters suchas damping ratio, naturalfrequency, andlock timeoftheclock anddata recovery circuit.