Nonlinear CA based Design of Test Set Generator Targeting Pattern Resistant Faults
Sukanta Anirban, Kundu Biplab, K Sikdar · 2004
This paper reports the design of an cient Test Set Generator ( T S G ) for circuit. It is built around the regular staructure of Cellular Automata (CA) employing nonlinear C A rules and targets detection of hard-to-detect pseudo-random pattern resistant faults. The optimal design of T S G structure is achieved with the framework of (Simulated Annealing) to ensure proper selection of CA rules for T S G cells. of T S G in comparison to linear based designs is validated through experimentation.