Modified Genetic Algorithm for Deciding LFSR Configuration
Nisha Haridas, M. Nirmala Devi · 2011
The most important criteria to be optimized for the patterns generated for built in self test (BIST) maximizing the fault coverage and minimizing the test run time. For an linear feedback shift register (LFSR) based BIST, it is dependent on the characteristic polynomial and initial state (seed) selected for the purpose. In this paper modified genetic algorithm is used to search polynomial-seed pair that produces optimum pattern for a given circuit. The experiments performed on ISCAS ’85 benchmark circuits could determine a polynomial-seed pair that has fault coverage above 95 % using minimum number of vectors possible.