Nonenumerative Pa elay Fault Coverage Estimation with timal Algorithms
Dimitrios Kagaris, Spyros Tragoudas, Dimitrios Karayiannis · 1997
A recent method proposed that a lower bound on the number of path delay faults excited by a given test set can be computed using a set indepen- dent lines that form a cut. For each line in the cut a subcircuit consisting of all paths that contain the line is defined, and a lower bound to the number of excited path delay faults can be obt A polynomial time algorithm mputing the maximum cardi- results show that the m the lower bound on the number of excited path delay faults is. More subcircuits may be generated only in a heuristic manner. It was proposed to consider two ore line-disjoint cuts Ci. We prop ere only one Ca must be a cut. on novel algorithms, and results in more subcircuits than the previous one.