A Failure Testing System with March C- Algorithm for Single Event Upset
Peng Wang, Zhen Li, Chengxiang Jiang, Wei Shao, Xue Qiannan · International Journal of Hybrid Information Technology · 2014
A testing system has been designed to detect the single event upset failure of SRAM chips in this paper: a visual test bench for failure monitoring is developed based on LabVIEW, it could perform the task of data acquisition, storage and results analysis.At the testing board, the test vectors based on March C-algorithm are written to the reference SRAM and the under-test SRAM through FPGA.NI HSDIO-6548 card is used to collect all the data from the SRAMs, judging whether SEU failure occurred according to comparison results.The system could accomplish the work of real-time monitoring the failure status and test process with a good extensibility.