EFFICIENT DIAGNOSTIC METHOD FOR DETECTING THE DISTINGUISHED AND INDISTINGUISHED FAULTS
T. Leela Srinidhi, M. Devanathan · 2013
VLSI systems are subjected to increasing the circuit defects, error and significant parametric variations, which cannot be reduced below certain levels and must be handled by new design methods .The level of fault coverage is desirable but rarely attainable in most practical circuits. During manufacturing test, high fault coverage is particularly valuable. Testing is a process to find the fault and to improve the effectiveness of test set fault coverage. The ability to evaluate the testability of digital circuits before they are actually implemented is critical for designing highly reliable systems. This paper presents a technique for identifying the distinguished and indistinguished faults in both combinational and sequential digital circuits. Here, the combinational and sequential circuits were designed and the output responses were taken. For these circuits fault models were injected and faulty output responses are taken. From this, both output responses were compared and fault models are identified.