Symbolic methods for parameter extraction in fault diagnosis and modelling
Gianfranco Avitabile, B. Chellini, Giulio Fedi, Antonio Luchetta, S. Manetti, Maria Cristina Piccirilli · Florence Research (University of Florence) · 2001
Purpose of this paper is to highlight the advantages of the symbolic approach in fault location of analog circuits, in parameter extraction of electronic circuits and in the determination of testability and ambiguity groups, which are very important aspects within the above mentioned activities.