DI?l Perspectives on ITC86
Charles E. Radke · 1986
increasing useofsurface-mounted devices. Thecommitment ofPhilips tozerodefect highquality products, hesaid, mandated theneedforaunified test strategy that canbesmoothly applied at boththeIClevel andtheboardlevel. Hecited theestablishment ofthejoint TestAction Groupamongmanufacturers asthefirst steptoward a consensus ontestable design. Richard SedmakofSelf-Test Services spoke onthetopic ofcomplex test problems associated withnewtechnologies. Sedmakbelieves that traditional external testing will ultimately facepermanent physical limitations, andtheonly solution is built-in test. Apanel tookuptheclassical debate ofthedeterministic approach. Some panel membersstressed theimportance ofknowing exactly whatpercentage of faults thetest covers, citing thebenefits