A Two-Step BIST Scheme for Operational Amplifier
Jun Yuan, Masayoshi Tachibana · 2012
This paper presents a two-step Built-in Self-Test (BIST) scheme and its implementation for Operational Amplifier (Opamp). In addition to the catastrophic faults, the proposed technique can particularly detect the capacitance variation in the compensation capacitor by combining the current-based test with the offset-based test to detect the physical defects in the Opamp. The circuit-level simulation results of the proposed BIST system are presented to demonstrate the feasibility of the proposed BIST scheme with high fault coverage of 98%.