Small Test Set Generation with High Diagnosability
Anupam Bhar, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur · Journal of Circuits Systems and Computers · 2015
Between fault detection and diagnostic test, there are many tests with varying degrees of diagnosability. There is trade-off between diagnosability of the test and its length. High diagnosability test is longer and takes more time. In this work, we tried to balance both by generating test slightly longer than normal detection test but with high diagnosability, without affecting fault coverage. The order of test vector application to attain more fault and diagnostic coverage in fewer test patterns is also mentioned. If more diagnosability is required, test vectors till the lower order should be used, whereas shorter test compromises on diagnosability. Our results show similar distinguishing capability as compared with a recent work but with 90% reduction in normalized time. The fault model used in this work is stuck-at fault model.