In-Situ, Real-Time Detector for Faults in Solder Joint Networks Belonging to Operational, Fully Programmed Field Programmabmle Gate Arrays (FPGAS)
James P. Hofmeister, Pradeep Lall, R.J. Graves · Conference record (1995) - Autotestcon/Conference record - Autotestcon · 2006
In this paper we introduce an in-situ solder-joint built-in self-test (SJ BIST) for detecting high-resistance faults in operational, fully-programmed field programmable gate arrays (FPGAs). The approach is simple to implement, offers a method to detect high- resistance faults that result from damaged solder-joints, and uses a maximum of one small capacitor externally-connected to each selected test pin or each group of two test pins.