Demodulation based testing of off-chip driver performance
Wilfried Daehn · 2005
untested ports This paper presents a new technique for testing the performance of off chip drivers (OCDs). It is based on the use of periodic signals and a demodulation based analysis in the frequency domain The technique is particular useful for replacing expensive time domain tests of OCD performance by simpler and less expensive phase shift measurements in the frequency domain. Such tests can easily be performed by low cost external test circuitry or low cost ATE. ATE (off chip test controller)