Pattern-dependent bit error characteristics induced by asymmetrically filtering of CS-RZ signal
Akira AGATA, Takehiro Tsuritani, Itsuro Morita, Noboru Edagawa · Electronics Letters · 2003
The pattern dependency in bit error characteristics of asymmetrically filtered CS-RZ signals has been experimentally and numerically studied. It was found that the bit error intensively occurs just after the end of a long sequence of 1s or 0s for strong asymmetrical filtering.