A Programmable Window Comparator for Analog Online Testing
Amit Laknaur, Rui Xiao, Haibo Wang · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007
This paper discusses the challenge of designing window comparators for analog online testing applications. A programmable window comparator with adaptive error threshold is presented. Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design. Measurement results of the fabricated comparator circuit are also presented.