The fail-stop controller AE11
Eberhard Bohl, T. Lindenkreuz, Richard Magdalena Stephan · 2002
Using on-chip fault detection measures the fail-stop controller. AE11 was developed for safety critical applications aiming at high volume production of automotive and railway electronics. The trade-off between high defect coverage, short reaction time to faults and low chip area overhead results in a combination of concurrent checking, built-in self-test and built-in current-monitoring (I/sub DDQ/-test).