Multiple-fault location of analog circuits
R.M. Biernacki, J.W. Bandler · IEEE Transactions on Circuits and Systems · 1981
This paper deals with multiple-fault detection for linear analog circuits. The method proposed is based on measurements of voltage using current excitations and has been developed for the location of a number of faults. It utilizes certain algebraic invariants of faulty elements. Computationally, it depends on checking the consistency or inconsistency of suitable sets of linear equations. The equations themselves are formulated via adjoint circuit simulations.