A 2-rail logic combinational circuit with easy detection of stuck-open and stuck-on faults in FETs
Hideo Ito · 1991
A design method for a 2-rail logic combinational circuit is proposed, where stuck-open and stuck-on faults in FETs can be easily detected. In the proposed circuit design, 4 FETs are added to each gate in a conventional 2-rail logic circuit. Two logical gates, OR and AND, are also added to the circuit as fault observing gates. A test can be easily generated and fault observation is easy. Stuck-at faults and stuck-open faults on lines are also detected by the test.>