Extended Fault-Tolerant Cycle Embedding in Faulty Hypercubes
Sun‐Yuan Hsieh, Nai-Wen Chang · IEEE Transactions on Reliability · 2009
We consider fault-tolerant embedding, where an n-dimensional faulty hypercube, denoted byQn, acts as the host graph, and the longest fault-free cycle represents the guest graph. LetFvbe a set of faulty nodes inQn. Also, letFebe a set of faulty edges in which at least one end-node of each edge is faulty, and letFebe a set of faulty edges in which the end-nodes of each edge are both fault-free. An edge inQnis said to be critical if it is either fault-free or inFe. In this paper, we prove that there exists a fault-free cycle of length at least 2n-2|Fv| inQn(nges 3) with |Fe| les 2n-5, and |Fv|+|Fe| les 2n-4 , in which each node is incident to at least two critical edges. Our result improves on the previously best known results reported in the literature, where only faulty nodes or faulty edges are considered.