Explorations of sequential ATPG using Boolean satisfiability
H. Konuk, Tracy Larrabee · 2002
Presents a sequential test generation method based on Boolean satisfiability. The method produces near-minimal test sizes. The authors discuss the flexibility provided by Boolean satisfiability to extend the fault model to realistic faults. Experimental results using ISCAS-89 benchmark circuits and comparisons with previously published results are presented.>