Self-testable pipelined ADC with low hardware overhead
E. Peralías, Gloria Huertas, Adoracion Rueda, J.L. Huertas · 2002
This paper presents a BIST scheme for the structural testing of pipelined ADCs. The operational principle relies on testing every ADC stage reconfigured as an A/D-D/A block and applying as input a set of analog DC values. These values have been determined as the appropriate and simple stimuli giving a single output signature. A new output signature is proposed allowing a low-cost digital domain test evaluation. The new technique is intended to be used in pipelined converters of an arbitrary number of conversion stages and provided with a digital correction mechanism.