Lessons learned from practical applications of BIST/B-S technology
Najmi Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau · 2002
Since Lucent Technologies (formerly AT&T) launched the Built-In Self-Test/Boundary-Scan (BIST/B-S) program in mid 1980's, over 200 devices and 80 circuit packs have incorporated BIST/B-S. These are from over 25 different project areas in various business units including Switching, Transmission, Wireless, Micro-Electronics, Federal Systems, and Consumer Products. Furthermore, since the early 1990's we have begun to see the full life-cycle impact of BIST and Boundary-Scan as a large quantity of hardware with BIST/B-S has gone full-cycle from design through manufacturing. We expect the steady growth in designs with BIST/B-S to continue and feel that the time is right to share our experiences and lessons learned from all levels: device, board, and system.