Design of fully testable circuits by functional decomposition and implicit test pattern generation
Bernd Steinbach, M. Stockert · 2002
The functional decomposition is known as a method to design digital circuits. The authors want to demonstrate and prove a way to design fully testable combinatorial circuits by this method. Furthermore, they show the opportunity of calculating the test pattern instantly during the synthesis. This pattern generation uses the same data and function terms as the generation of the circuit structure and so it causes only small additional expense.>