BIT for intelligent system design and condition monitoring
Robert X. Gao, Abhijit P. Suryavanshi · IEEE Transactions on Instrumentation and Measurement · 2002
The increasing complexity of microelectronic circuitry, as witnessed by multi-chip modules and system-on-a-chip and the rapid growth of manufacturing process automation, require that more effective and efficient testing and fault diagnosis techniques be developed to improve system reliability, reduce machine down time, and enhance productivity. As a design philosophy, built-in-test (BIT) is receiving increasing attention from the research community. This paper presents an overview of BIT research in several areas of industry, including semiconductor, manufacturing, aerospace and transportation.