Design of signature circuits based on weight distributions of error-correcting codes
Kei Iwasaki, N. Yamaguchi · 2002
Design techniques that can improve the aliasing probabilities of signature circuits for VLSI BIST (built-in self-test) are presented. The proposed techniques are based on the binary weight distributions of error-correcting codes over GF(2) and GF(2/sup m/). The technique considered for calculating the aliasing probability of signature circuits is appropriate for a vector supercomputer. Some of the calculations were done using the S810 supercomputer. The vectorization ratio of the program was 99.885% for an MISR (multiple-input signature register) with 16 inputs and for test length n=100-105. >