New test data decompressor for low power applications
Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer · Proceedings - ACM IEEE Design Automation Conference · 2007
The paper presents a novel low power test scheme integrated with the embedded deterministic test environment. It reduces significantly switching rates in scan chains with minimal hardware modification. Experimental results obtained for industrial circuits clearly indicate that switching activity can be reduced up to 150 times along with improved compression ratios.