MOS-IC Process And Device Characterization Within Philips
S. Swaving, A. Ketting, Albert Trip · 2005
An integrated generic approach allows full exchangeability of testchips and testprograms between MOS IC RkD and production centres within Philips, resulting in a complete comparability of testdata. For the analysis of the testdata a very powerful and flexible graphical and stakisticai tool is avaiiabie.