Simulation and generation of I/sub DDQ/ tests for bridging faults in combinational circuits
Sourish Chakravarty, Paul J. Thadikaran · 2002
In the absence of information about the layout and for better defect coverage test generation and fault simulation systems must target all bridging faults. The authors show that an I/sub DDQ/ Test Set that detects all two line bridging faults also detects all multiple line, single cluster bridging faults. A novel algorithm for simulating I/sub DDQ/ tests for all two-line bridging faults in combinational circuits is presented. Experimental results on using randomly generated I/sub DDQ/ test sets for detecting bridging faults are presented. These results point to the computational feasibility of targeting all two line bridging faults in combinational circuits, for the purpose of I/sub DDQ/ test generation.>