An approach to improve the resolution of defect-based diagnosis
I. Yamazaki, Hisamitsu Yamanaka, T. Ikeda, Masahiro Takakura, Yasuo Satô · 2002
Presents a practical approach to improve the resolution of defect-based diagnosis. To diagnose the faulty chips, various techniques are needed as well as modeling the defects precisely. In this paper, some techniques using the layout information, a multi-test diagnosis method, and a testing method for the delay fault are discussed, and some experimental results of actual chips are shown. The resolution of the diagnosing test patterns is also discussed.