A flexible path selection procedure for path delay fault testing
Irith Pomeranz, Sudhakar M. Reddy · 2003
We describe a path selection procedure that selects target faults for path delay fault test generation. Since large numbers of path delay faults may be untestable, the proposed procedure does not select a fixed set of paths. Instead, it provides compactly represented subsets of paths, referred to as super-paths, and allows the test generation procedure to select one path out of each subset based on testability considerations.