Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology
Jeong-Uk Han, Yong Kyu Lee, Chang Min Jeon, Jido Ryu, Eun-Mi Hong, S. Yang, Young-Ho Kim, Hyucksoo Yang, Hyunkhe Yoo, Jae-Min Yu, Hoonjin Bang, Seungwon Lee, ByeongHoon Lee, Daesop Lee, Eunseung Jung, Chilhee Chung · 2009
We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle endurance and 10-year retention for the successful smart card application.