Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment
Frank-Uwe Faber, Mattias Beck, Markus Rudack, O. Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger · 2009
This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods.