An approach to mixed circuits testing
S. Bracho, Mar Martinez, J. Arguelles · 2002
A test stimuli generation and a signature analysis method are proposed for a mixed mode circuits. The processes are based on a catastrophic fault model simulated at the transistor level, and on a measure of the transient response of the current used by the circuit when applying the stimuli. A built-in dynamic current sensor is proposed in order to perform the transient analysis of the current used in an actual ATE systems.>