A case study on the implementation of the Illinois Scan Architecture
Fei-Sheng Hsu, Kenneth M. Butler, Janak H. Patel · 2002
Scan based test techniques offer a very efficient alternative to achieve high fault coverage when compared to functional pattern testing. As circuit sizes grow ever larger, test data volume and test application time grow unwieldy even in the very efficient scan based designs. The Illinois Scan Architecture is a low cost alternative to conventional scan. In this paper, we present the first ever reported case study of the effectiveness of the Illinois Scan Architecture on an industrial circuit.