Multifrequency approach to fault diagnosis
M.N.S. Swamy, Leonid M. Roytman, E.I. Plotkin · International Journal of Circuit Theory and Applications · 1984
Abstract This paper deals with multiple‐fault diagnosis for linear analogue circuits. the proposed approach is based on multifrequency measurements of some voltage (transfer function) at the accessible output port and can be used for multiple‐fault location. It uses certain algebraic invariant properties of the transfer function with respect to the set of faulty elements. Computationally this approach reduces checking the problem of multiple‐fault diagnosis to one of the existence or non‐existence of a common solution of two systems of linear equations; this amounts to the finding of the rank of a matrix. These linear equations are derived via symbolic representation of the measured voltage (transfer function) accessible for measurements. A numerical example of the application of such an approach is given.