Empirical design bugs prediction for verification
Qi Guo, Tianshi Chen, Haihua Shen, Yunji Chen, Yue Wu, Weiwu Hu · 2011
Coverage model is the main technique to evaluate the thoroughness of dynamic verification of a Design-under-Verification (DUV). However, rather than achieving a high coverage, the essential purpose of verification is to expose as many bugs as possible. In this paper, we propose a novel verification methodology that leverages the early bug prediction of a DUV to guide and assess related verification process. To be specific, this methodology utilizes predictive models built upon artificial neural networks (ANNs), which is capable of modeling the relationship between the high-level attributes of a design and its associated bug information. To evaluate the performance of constructed predictive model, we conduct experiments on some open source projects. Moreover, we demonstrate the usability and effectiveness of our proposed methodology via elaborating experiences from our industrial practices. Finally, discussions on the application of our methodology are presented.