Concurrent pseudo-exhaustive testing of combinational VLSI circuits
Bassam Shaer · IEEE Computer Society Annual Symposium on VLSI · 2004
Partitioning and concurrent pseudo-exhaustive test scheme has been proposed as a powerful solution to very large scale integrated (VLSI) testing problem. Pseudo-exhaustive test methodology provides effective, 100% fault coverage for all testable stuck-at faults. After partitioning the ISCAS'85 benchmark circuits, results were processed and studied to develop a procedure for concurrent testing. Tools written in C/C++ to process benchmark circuits and to produce sets of primary outputs and partitioned points that can be tested concurrently were developed.