Testing wafer scale arrays: constant testability under multiple faults
Donatella Sciuto, Fabrizio Lombardi · 2002
Deals with the testing of one-dimensional arrays in a complexity independent of array size (C-testability). The first aspect of C-testability analyzed in this paper, is a new model for the internal organization of a basic cell under a restricted fault assumption. This paper also presents a new approach for multiple fault detection of one-dimensional (linear) arrays.>