A new class of fault models and test algorithms for dual-port dynamic RAM testing
Vladimir Castro Alves, Omar Kebichi, Adriane Pedroso Dias Ferreira · 2002
In this paper, the authors present a new class of fault models called duplex pattern sensitive faults that represents more accurately the actual faults that can occur in dual-port DRAMs. Then, they propose an efficient linear test algorithm that allows 100% fault coverage for the considered fault model.>