A comparison of stuck-at fault coverage and I/sub DDQ/ testing on defect levels
P.C. Wiscombe · 2002
This paper presents experimental data comparing the effect of functional stuck-at fault testing and I/sub DDQ/ testing on defect levels. Results obtained for parts tested with varying stuck-at fault coverage are compared with results from I/sub DDQ/ testing. Empirical data are analyzed against two theoretical fault models to demonstrate that correlation can be obtained. The results indicate that significant benefits can be gained from I/sub DDQ/ testing, even with non-deterministic test locations and relatively few measurements. Data are also presented on the impact of I/sub DDQ/ testing on burn-in monitoring and customer field failures of ASIC designs. Finally some practical issues associated with implementing I/sub DDQ/ tests are discussed.>