A shared built-in self-repair analysis for multiple embedded memories
J. Ohtani, Tsukasa Ooishi, Takeshi Kawagoe, M. Niiro, Masayuki Maruta, Hideto Hidaka · 2002
A shared built-in self-repair analysis scheme (Shared-BISA) for multiple embedded memory cores in the SOC is proposed to realize minimum area penalty independent of the number of embedded memory cores. A compact reconfigurable CAM array in the BISA circuitry realizes a flexible redundancy analysis structure to cope with various memory core and redundancy structures, and a high-speed operation up to 500 MHz.