Diagnosis oriented test pattern generation
Paolo Enrico Camurati, Antonio Lioy, P. Prinetto, Matteo Sonza Reorda · PORTO Publications Open Repository TOrino (Politecnico di Torino) · 1990
This paper addresses the generation of test patterns having diagnostic properties. The authors goal is to produce patterns able not only to detect, but also to distinguish faults in combinational circuits. A general formalization of the problem is first given; a new technique is then introduced to improve the diagnostic capabilities of a traditional automatic test pattern generation (ATPG); the experimental results showing its effectiveness are finally presented. >