Speed binning with path delay test in 150-nm technology
Bruce Cory, R. Kapur, B. Underwood · IEEE Design & Test of Computers · 2003
What would it take to reduce speed binning's dependency on functional testing? One answer is a structural at-speed test approach that can achieve the same effectiveness as functional testing. The authors of this article offer a formula to relate structural critical-path testing frequency to system operation frequency. They demonstrate that there can be a high correlation between frequencies resulting from structural testing and those resulting from functional testing.