Functional testing of modern microprocessors
T.J.W. Verhallen, A.J. van de Goor · 2003
In the early 1980s, a method was developed for functional testing of microprocessors. Modern microprocessors have a functionality, such as on-chip caches, which is not covered by that model. This paper extends that functional model and proposes fault models, together with tests for such modern microprocessors. The proposed concepts and algorithms have been applied to the Intel i860 microprocessor chip.>